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Development of MHz X‐ray phase contrast imaging at the European XFEL

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journal contribution
posted on 2024-12-16, 07:01 authored by Jayanath CP Koliyadu, Daniel Moško, Eleni Myrto Asimakopoulou, Valerio Bellucci, Šarlota Birnšteinová, Richard Bean, Romain Letrun, Chan Kim, Henry Kirkwood, Gabriele Giovanetti, Nerea Jardon, Janusz Szuba, Trey GuestTrey Guest, Andreas Koch, Jan Grünert, Peter Szeles, Pablo Villanueva-Perez, Fabian Reuter, Claus-Dieter Ohl, Mike Andreas Noack, Francisco Garcia-Moreno, Zuzana Kuglerová-Valdová, Libor Juha, Martin Nikl, Wataru Yashiro, Hitoshi Soyama, Daniel Eakins, Alexander M Korsunsky, Jozef Uličný, Alke Meents, Henry N Chapman, Adrian MancusoAdrian Mancuso, Tokushi Sato, Patrik Vagovič
We report on recent developments that enable megahertz hard X-ray phase contrast imaging (MHz XPCI) experiments at the Single Particles, Clusters, and Biomolecules and Serial Femtosecond Crystallography (SPB/SFX) instrument of the European XFEL facility (EuXFEL). We describe the technical implementation of the key components, including an MHz fast camera and a modular indirect X-ray microscope system based on fast scintillators coupled through a high-resolution optical microscope, which enable full-field X-ray microscopy with phase contrast of fast and irreversible phenomena. The image quality for MHz XPCI data showed significant improvement compared with a pilot demonstration of the technique using parallel beam illumination, which also allows access to up to 24 keV photon energies at the SPB/SFX instrument of the EuXFEL. With these developments, MHz XPCI was implemented as a new method offered for a broad user community (academic and industrial) and is accessible via standard user proposals. Furthermore, intra-train pulse diagnostics with a high few-micrometre spatial resolution and recording up to 128 images of consecutive pulses in a train at up to 1.1 MHz repetition rate is available upstream of the instrument. Together with the diagnostic camera upstream of the instrument and the MHz XPCI setup at the SPB/SFX instrument, simultaneous two-plane measurements for future beam studies and feedback for machine parameter tuning are now possible.

Funding

This work received funding from EuXFEL R&D ‘MHz X-ray microscopy: From demonstration to method’ 2020–2022; Ro¨ntgen-A˚ngstro¨m Cluster, Bundesministerium fu¨r Bildung und Forschung (grant No.18XXA), Vetenskapsra˚det (VR) (2017-06719), the Ro¨ntgen A˚ngstro¨m Cluster INVISION project; the HORIZON EIC Pathfinder, MHz-TOMOSCOPY project (grant agreement No. 101046448).

History

Publication Date

2025-01-01

Journal

Journal of Synchrotron Radiation

Volume

32

Issue

1

Pagination

12p.

Publisher

Wiley

ISSN

0909-0495

Rights Statement

© The Authors 2025. This is an open-access article distributed under the terms of the Creative Commons Attribution (CC-BY) Licence, which permits unrestricted use, distribution, and reproduction in any medium, provided the original authors and source are cited.