Correlation between electronic micro-roughness and surface topography in two-dimensional surface conducting hydrogen-terminated diamond

Yianni, Steve; Creedon, Daniel L; Schenk, Alex; Xing, Kaijian; Akhgar, Golrokh; Hoxley, David; Ley, Lothar; McCallum, Jeffrey C; Pakes, Christopher

doi:10.26181/60ad9b99e7eed

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Correlation between electronic micro-roughness and surface topography in two-dimensional surface conducting hydrogen-terminated diamond

journal contribution

posted on 2021-05-26, 00:51 authored by Steve YianniSteve Yianni, Daniel L Creedon, Alex SchenkAlex Schenk, Kaijian Xing, Golrokh Akhgar, David HoxleyDavid Hoxley, Lothar LeyLothar Ley, Jeffrey C McCallum, Christopher PakesChristopher Pakes

No description supplied

Funding

DP150101673

DP190102852

History

Publication Date

2021-06-01

Journal

Diamond and Related Materials

Volume

116

Article Number

108377

Pagination

pp.8

Publisher

Elsevier

ISSN

0925-9635

Rights Statement

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