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Automated Labeling and Learning for Physical Layer Authentication against Clone Node and Sybil Attacks in Industrial Wireless Edge Networks

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journal contribution
posted on 2021-03-08, 23:38 authored by S Chen, Z Pang, H Wen, Kan YuKan Yu, T Zhang, Y Lu
© 2005-2012 IEEE. In this article, a scheme to detect both clone and Sybil attacks by using channel-based machine learning is proposed. To identify malicious attacks, channel responses between sensor peers have been explored as a form of fingerprints with spatial and temporal uniqueness. Moreover, the machine-learning-based method is applied to provide a more accurate authentication rate. Specifically, by combining with edge devices, we apply a threshold detection method based on channel differences to provide offline training sample sets with labels for the machine learning algorithm, which avoids manually generating labels. Therefore, our proposed scheme is lightweight for resource constrained industrial wireless devices, since only an online-decision making is required. Extensive simulations and experiments were conducted in real industrial environments. Both results show that the authentication accuracy rate of our strategy with an appropriate threshold can achieve 84% without manual labeling.

Funding

This work was supported in part by the National Natural Science Foundation of China (NSFC) under Grant 61572114, in part by the National Major R&D Program (2018YFB0904900 and 2018YFB0904905), in part by Sichuan Science and Technology Service Development Project (18KJFWSF0368), and in part by Sichuan Science and Technology Basic Research Condition Platform Project (2018TJPT0041).

History

Publication Date

2021-03-01

Journal

IEEE Transactions on Industrial Informatics

Volume

17

Issue

3

Pagination

(p. 2041-2051)

Publisher

IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC

ISSN

1551-3203

Rights Statement

The Author reserves all moral rights over the deposited text and must be credited if any re-use occurs. Documents deposited in OPAL are the Open Access versions of outputs published elsewhere. Changes resulting from the publishing process may therefore not be reflected in this document. The final published version may be obtained via the publisher’s DOI. Please note that additional copyright and access restrictions may apply to the published version.

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