La Trobe

File(s) stored somewhere else

Please note: Linked content is NOT stored on La Trobe and we can't guarantee its availability, quality, security or accept any liability.

An advanced workflow for single-particle imaging with the limited data at an X-ray free-electron laser

journal contribution
posted on 2020-12-10, 00:57 authored by D Assalauova, YY Kim, S Bobkov, R Khubbutdinov, M Rose, R Alvarez, J Andreasson, Eugeniu BalaurEugeniu Balaur, A Contreras, H DeMirci, L Gelisio, J Hajdu, MS Hunter, RP Kurta, Haoyuan Li, M McFadden, R Nazari, P Schwander, A Teslyuk, P Walter, PL Xavier, CH Yoon, S Zaare, VA Ilyin, RA Kirian, BG Hogue, A Aquila, IA Vartanyants
© 2020. An improved analysis for single-particle imaging (SPI) experiments, using the limited data, is presented here. Results are based on a study of bacteriophage PR772 performed at the Atomic, Molecular and Optical Science instrument at the Linac Coherent Light Source as part of the SPI initiative. Existing methods were modified to cope with the shortcomings of the experimental data: inaccessibility of information from half of the detector and a small fraction of single hits. The general SPI analysis workflow was upgraded with the expectation-maximization based classification of diffraction patterns and mode decomposition on the final virus-structure determination step. The presented processing pipeline allowed us to determine the 3D structure of bacteriophage PR772 without symmetry constraints with a spatial resolution of 6.9 nm. The obtained resolution was limited by the scattering intensity during the experiment and the relatively small number of single hits.


Publication Date







Part 6


12p. (p. 1102-1113)


International Union of Crystallography



Rights Statement

The Author reserves all moral rights over the deposited text and must be credited if any re-use occurs. Documents deposited in OPAL are the Open Access versions of outputs published elsewhere. Changes resulting from the publishing process may therefore not be reflected in this document. The final published version may be obtained via the publisher’s DOI. Please note that additional copyright and access restrictions may apply to the published version.

Usage metrics