La Trobe

The role of defects on CdTe detector performance

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posted on 2023-03-23, 10:22 authored by P. J Sellin, A Lohstroh, P Siffert, David Ian Hoxley, M. E Ozsan, M Sowinska, A Simon
IEEE Nuclear Science Symposium (2003 : Piscataway, NJ.)

History

Publication Date

2004-07-01

Proceedings

IEEE Nuclear Science Symposium Conference Record, 5: 3306-3310

Publisher

[S.l.]: Institute of Electrical and Electronics Engineers (IEEE).

Volume

5

Pagination

3306-3310

ISSN

1082-3654

Rights Statement

Open Access. This material is posted here with permission of the IEEE. Such permission of the IEEE does not in any way imply IEEE endorsement of any of La Trobe University's products or services. Internal or personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution must be obtained from the IEEE by writing to pubs-permissions@ieee.org. By choosing to view this document, you agree to all provisions of the copyright laws protecting it. This paper was reprinted from the IEEE Nuclear Science Symposium Conference Record, v. 5, 2003 p. 3306-3310 and may be found at http://dx.doi.org/10.1109/NSSMIC.2003.1352602. Copyright (2007) IEEE. Romeo Green Publisher.

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arrow migration 2023-03-04 20:38. Ref: 25aacc. IDs:['http://hdl.handle.net/1959.9/442407', 'latrobe:26334', 'URN:ISSN:1082-3654', 'RM Number: 0100025160']

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    Keywords

    020406 Surfaces and Structural Properties of Condensed Matter0204 (four-digit-FOR)

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    In Copyright

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