IEEE International Workshop on Electronic Design, Test & Applications, (2nd : 2004 : Perth, Australia)
ProceedingsProccedings of the Second IEEE International Workshop on Electronic Design, Test & Applications (DELTA 2004), pp. 378-383
Publisher[S.l.]: Institute of Electrical and Electronics Engineers (IEEE).
Rights StatementOpen Access. This material is posted here with permission of the IEEE. Such permission of the IEEE does not in any way imply IEEE endorsement of any of La Trobe University's products or services. Internal or personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution must be obtained from the IEEE by writing to firstname.lastname@example.org. By choosing to view this document, you agree to all provisions of the copyright laws protecting it. This paper was reprinted from the Proccedings of the Second IEEE International Workshop on Electronic Design, Test & Applications, 2004 p. 378-383 and may be found at http://dx.doi.org/10.1109/DELTA.2004.10019. Copyright (2004) IEEE. Romeo Green Publisher.
Data sourcearrow migration 2023-03-04 20:38. Ref: 25aacc. IDs:['http://hdl.handle.net/1959.9/398295', 'latrobe:23056', 'URN:ISBN:0769520812', 'RM Number: 0100020235']